FABRICATION OF NANOMETER-SCALE STRUCTURES ON INSULATORS AND IN MAGNETIC-MATERIALS USING A SCANNING PROBE MICROSCOPE

被引:17
作者
HOSAKA, S [1 ]
KOYANAGI, H [1 ]
KIKUKAWA, A [1 ]
MIYAMOTO, M [1 ]
IMURA, R [1 ]
USHIYAMA, J [1 ]
机构
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 03期
关键词
D O I
10.1116/1.587843
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Field evaporation and electron induced local heating in scanning probe microscopes [atomic force microscope, scanning tunnel microscope (STM), and magnetic force microscope (MFM)] are investigated for a nanometer-sized structure fabrication on an insulator and for a fine magnetic domain formation in a magnetic material. Application of negative voltage to the gold-coated AFM probe can be provided to make gold lines 40 nm wide and dots 20 nm in diameter on SiO2/Si by field evaporation. Reversely, in a positive voltage, thermal processes are dominant, one of which is the formation of nanometer-sized magnetic domains produced by electron induced local heating using STM and MFM. The proposed MFM recording can form 60 × 240 nm2 domains in a Pt/Co multilayer magnetic film and they can be observed with the same probe.
引用
收藏
页码:1307 / 1311
页数:5
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