IN-SITU EXAMINATION OF ANODIC SILVER-OXIDE FILMS BY EXAFS IN THE REFLECTION MODE

被引：31

作者：

HECHT, D

BORTHEN, P

STREHBLOW, HH

机构：

[1] Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1995年 / 381卷 / 1-2期

关键词：

X-RAY ABSORPTION FINE STRUCTURE; ANODIC OXIDATION; SILVER OXIDE FILMS;

D O I：

10.1016/0022-0728(94)03611-6

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Thin sputter-deposited silver films were oxidized anodically in 1 M NaOH. The structural modifications of the silver electrode surface during the course of a complete oxidation/reduction cycle were studied in situ with the grazing incidence X-ray absorption fine structure technique. The results show that the short-range order structure of the anodic oxide films is similar to that of crystalline Ag2O powder at 0.6 V while it resembles the structure of crystalline AgO at 0.85 V (SHE). Besides a significantly reduced reflectivity, the metal surface revealed a more disordered near-order structure after a completed oxidation/reduction cycle.

引用

页码：113 / 121

页数：9

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