RADIATION-DAMAGE IN SILICON STRIP DETECTORS

被引：24

作者：

DIETL, H

GOOCH, T

KELSEY, D

KLANNER, R

LOFFLER, A

PEPE, M

WICKENS, F

机构：

[1] CERN,CH-1211 GENEVA 23,SWITZERLAND

[2] RUTHERFORD APPLETON LAB,DIDCOT OX11 0QX,OXON,ENGLAND

[3] UNIV BRISTOL,BRISTOL BS8 1TH,AVON,ENGLAND

[4] UNIV HAMBURG,D-2000 HAMBURG 13,FED REP GER

[5] DESY,D-2000 HAMBURG 52,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 253卷 / 03期

关键词：

D O I：

10.1016/0168-9002(87)90533-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：460 / 466

页数：7

共 13 条

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