X-RAY TOPOGRAPHIC STUDIES OF SIC CRYSTALS GROWN FROM VAPOR-PHASE

被引：5

作者：

RAI, RS ^{[1
]}

SINGH, G ^{[1
]}

SENGUPTA, SP ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVAT SCI,DEPT GEN PHYS & X-RAYS,CALCUTTA 700032,W BENGAL,INDIA

来源：

JOURNAL OF CRYSTAL GROWTH | 1983年 / 61卷 / 01期

关键词：

D O I：

10.1016/0022-0248(83)90293-2

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：170 / 172

页数：3

共 15 条

[1] DISLOCATIONS IN SILICON CARBIDE [J].

AMELINCKX, S ;

STRUMANE, G ;

WEBB, WW .

JOURNAL OF APPLIED PHYSICS, 1960, 31 (08) :1359-1370

[2] CRYSTAL SUBGRAIN MISORIENTATIONS OBSERVED BY X-RAY TOPOGRAPHY IN REFLECTION [J].

ARMSTRONG, RW ;

BOETTINGER, WJ ;

KURIYAMA, M .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (OCT) :417-424

[3] IMPERFECTIONS IN SOLUTION-GROWN BETA-SILICON CARBIDE CRYSTALS [J].

BARTLETT, RW ;

MARTIN, GW .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2324-+

[4] ELECTRON MICROSCOPY OF DISLOCATIONS AND OTHER DEFECTS IN SAPPHIRE AND IN SILICON CARBIDE THINNED BY SPUTTERING [J].

DRUM, CM .

PHYSICA STATUS SOLIDI, 1965, 9 (02) :635-&

[5]

FAUST TW, 1959, METHODS EXPERIMENTAL, V6, P147

[6] INTERFEROMETRIC STUDY OF ETCHPITS [J].

GEVERS, R ;

AMELINCKX, S ;

DEKEYSER, W .

NATURWISSENSCHAFTEN, 1952, 39 (19) :448-449

[7]

HORN FH, 1952, PHILOS MAG, V43, P1210

[8] DIRECTIONS OF DISLOCATION LINES IN CRYSTALS OF AMMONIUM HYDROGEN OXALATE HEMIHYDRATE GROWN FROM SOLUTION [J].

KLAPPER, H ;

KUPPERS, H .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (SEP1) :495-&

[9] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].

LANG, AR .

ACTA CRYSTALLOGRAPHICA, 1959, 12 (03) :249-250

[10] X-RAY MICROGRAPHIC STUDY OF SILICON CARBIDE CRYSTALS [J].

OHTA, K ;

TOMITA, T ;

WATANABE, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1965, 4 (09) :652-&

← 1 2 →