ATOMIC STEP CONTRAST FROM FORBIDDEN REFLECTIONS

[1] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[2] SURFACE-STRUCTURE OF (111) GOLD-FILMS SPUTTERED IN HIGH-VOLTAGE ELECTRON-MICROSCOPE - THEORETICAL-MODEL [J]. PHILOSOPHICAL MAGAZINE, 1977, 36 (06): : 1429 - 1444

[3] THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (10): : 609 - 619

[4] OUT-OF-ZONE EFFECTS IN DYNAMIC ELECTRON DIFFRACTION INTENSITIES FROM GOLD [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (SEP1) : 399 - &

[5] GROWTH AND DEFECT STRUCTURE OF LAMELLAR GOLD MICROCRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (07) : 3016 - &

[6] DARK-FIELD ELECTRON-MICROSCOPY OF DISSOCIATED DISLOCATIONS AND SURFACE STEPS IN SILICON USING FORBIDDEN REFLECTIONS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 48 (01): : 139 - 153

[7] ROSSOUW CJ, 1977, PHYS STATUS SOLIDI A, V45, P277

[8] SUITO E, 1960, J ELECTRON MICROSC, V8, P25

[9] HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 145 - 161

[1] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[2] SURFACE-STRUCTURE OF (111) GOLD-FILMS SPUTTERED IN HIGH-VOLTAGE ELECTRON-MICROSCOPE - THEORETICAL-MODEL [J]. PHILOSOPHICAL MAGAZINE, 1977, 36 (06): : 1429 - 1444

[3] THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (10): : 609 - 619

[4] OUT-OF-ZONE EFFECTS IN DYNAMIC ELECTRON DIFFRACTION INTENSITIES FROM GOLD [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (SEP1) : 399 - &

[5] GROWTH AND DEFECT STRUCTURE OF LAMELLAR GOLD MICROCRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (07) : 3016 - &

[6] DARK-FIELD ELECTRON-MICROSCOPY OF DISSOCIATED DISLOCATIONS AND SURFACE STEPS IN SILICON USING FORBIDDEN REFLECTIONS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 48 (01): : 139 - 153

[7] ROSSOUW CJ, 1977, PHYS STATUS SOLIDI A, V45, P277

[8] SUITO E, 1960, J ELECTRON MICROSC, V8, P25

[9] HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 145 - 161