QUADRUPOLES FOR SECONDARY ION MASS-SPECTROMETRY

被引：28

作者：

DAWSON, PH ^{[1
]}

机构：

[1] NATL RES COUNCIL CANADA,DIV PHYS,OTTAWA K1A OR6,ONTARIO,CANADA

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1975年 / 17卷 / 04期

关键词：

D O I：

10.1016/0020-7381(75)80018-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：447 / 467

页数：21

共 11 条

[1]

Benninghoven A., 1974, International Journal of Mass Spectrometry and Ion Physics, V13, P415, DOI 10.1016/0020-7381(74)83021-4

[2] OBSERVATION ON SURFACE-REACTIONS WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .1. METHOD [J].

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SURFACE SCIENCE, 1971, 28 (02) :541-+

[3] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .2. OXIDATION OF CHROMIUM IN MONOLAYER RANGE [J].

BENNINGHOVEN, A ;

MULLER, A .

SURFACE SCIENCE, 1973, 39 (02) :416-426

[4]

DAHL P, 1973, INTRO ELECTRON ION O

[5]

Dawson P. H., 1974, International Journal of Mass Spectrometry and Ion Physics, V14, P317, DOI 10.1016/0020-7381(74)80067-7

[6] ACCEPTANCE OF QUADRUPOLE MASS FILTER [J].

DAWSON, PH .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (04) :423-445

[7] DETERMINATION OF IMPLANTATION PROFILES IN SOLIDS BY SECONDARY ION MASS-SPECTROMETRY [J].

MAUL, J ;

WITTMAACK, K ;

SCHULZ, F .

PHYSICS LETTERS A, 1972, A 41 (02) :177-+

[8] DAS ELEKTRISCHE MASSENFILTER ALS MASSENSPEKTROMETER UND ISOTOPENTRENNER [J].

PAUL, W ;

REINHARD, HP ;

VONZAHN, U .

ZEITSCHRIFT FUR PHYSIK, 1958, 152 (02) :143-182

[9] SIMPLE, INEXPENSIVE SIMS APPARATUS [J].

SCHUBERT, R ;

TRACY, JC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (04) :487-491

[10] VELOCITY FILTERING FOR SECONDARY ION QUADRUPOLE MASS-SPECTROMETER [J].

SROUBEK, Z .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) :1403-1404

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