SPUTTERING BEHAVIOR OF BORON USING ELECTRON-CYCLOTRON-RESONANCE PLASMA

被引:3
作者
ITO, Y [1 ]
KURIKI, S [1 ]
SAIDOH, M [1 ]
NISHIKAWA, M [1 ]
机构
[1] JAPAN ATOM ENERGY RES INST,NAKA FUS RES ESTAB,NAKA,IBARAKI 31101,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 10期
关键词
ECR PLASMA; BORON SPUTTERING; BORON TEMPERATURE; BORON THIN FILM;
D O I
10.1143/JJAP.33.5959
中图分类号
O59 [应用物理学];
学科分类号
摘要
Boron sputtering by plasma ions is investigated using electron cyclotron resonance (ECR) discharge of neon gas. The temperature of boron on an electrode during the discharge becomes high enough that the resistance of boron is sufficiently small in comparison with that of the plasma sheath in the application of negative voltage V. Ion current flowing from the plasma and the line emission from the sputtered boron are measured as a function of V under conditions of microwave input power 200-500 W and the neon gas pressure 1-10 mTorr. The sputtering yield at ion energy E=3 keV is about one order of magnitude larger than that at E=0.5 keV. Boron thin films are prepared by the sputtering method in the case of V=-2 kV. The deposition rate normalized by the ion current is about 100 Angstrom/s/A measured at a distance of about 2 cm from the boron surface.
引用
收藏
页码:5959 / 5966
页数:8
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