PERFORMANCE COMPARISON OF INGAASP LASERS EMITTING AT 1.3 AND 1.55-MU-M FOR LIGHTWAVE SYSTEM APPLICATIONS

被引:10
作者
DUTTA, NK
WILSON, RB
WILT, DP
BESOMI, P
BROWN, RL
NELSON, RJ
DIXON, RW
机构
[1] LYTEL INC, SOMERVILLE, NJ USA
[2] GEN OPTRON, EDISON, NJ USA
[3] AT&T BELL LABS, LONG WAVE LENGTH DEVICE GRP, MURRAY HILL, NJ 07974 USA
[4] AT&T BELL LABS, LIGHTWAVE MAT GRP, MURRAY HILL, NJ 07974 USA
来源
AT&T TECHNICAL JOURNAL | 1985年 / 64卷 / 08期
关键词
LASERS; SEMICONDUCTOR; -; Performance;
D O I
10.1002/j.1538-7305.1985.tb00039.x
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Experimental results relative to the performances of real index-guided InGaAsP lasers emitting near 1. 3 and 1. 55 mu m are described and compared. The laser structures discussed are the etched mesa buried heterostructure, channeled substrate buried heterostructure, and the double channel planar buried heterostructure. The effect of Auger recombination and intervalence band absorption on the threshold current and external differential quantum efficiency is discussed. The effect of the larger Auger coefficient at 1. 55 mu m is compensated by a lower carrier density at threshold at 1. 55 mu m so that the total nonradiative current loss for lasers emitting at 1. 55 mu m is not significantly larger than that for lasers emitting at 1. 3 mu m. A small linear shunt leakage current (approximately 10 mA) can increase the T//0 to approximately 100K. We report threshold currents as low as 11 and 15 mA (at 30 degree C) and continuous-wave operating temperatures as high as 130 and 110 degree C for lasers emitting at 1. 3 and 1. 55 mu m, respectively.
引用
收藏
页码:1857 / 1884
页数:28
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