A detailed theoretical study of the growth of GaAs and AlGaAs in a multiwafer PLANET reactor has been performed and combined with experimental verification. The effects of variations in temperature profile, flow rate and flow distribution have been studied and basic trends have been identified. Parasitic depositions on the reactor ceiling have been studied and their profile has been understood. Based on the investigations, thickness homogeneity was improved to better than +/-1% on 3 inch wafers.