PHYSICAL LIMITS IN DIGITAL ELECTRONICS

被引：202

作者：

KEYES, RW ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PROCEEDINGS OF THE IEEE | 1975年 / 63卷 / 05期

关键词：

D O I：

10.1109/PROC.1975.9825

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：740 / 767

页数：28

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