QUANTITATIVE-ANALYSIS OF SILICATE MINERALS BY SECONDARY ION MASS-SPECTROMETRY AND LASER MICROPROBE MASS ANALYSIS - A COMPARATIVE-STUDY

被引：13

作者：

BEUSEN, JM

SURKYN, P

GIJBELS, R

ADAMS, F

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1983年 / 38卷 / 5-6期

关键词：

D O I：

10.1016/0584-8547(83)80183-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：843 / 851

页数：9

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