CHARGE COLLECTION IN N-TYPE GAAS SCHOTTKY-BARRIER DIODES STRUCK BY HEAVY ENERGETIC IONS

被引：6

作者：

GILBERT, RM

OVREBO, GK

SCHIFANO, J

OLDHAM, TR

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1984年 / 31卷 / 06期

关键词：

D O I：

10.1109/TNS.1984.4333552

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1570 / 1573

页数：4

共 13 条

[1] EVALUATION OF EPITAXIAL N-GAAS FOR NUCLEAR RADIATION DETECTION [J].

EBERHARDT, JE ;

RYAN, RD ;

TAVENDALE, AJ .

NUCLEAR INSTRUMENTS & METHODS, 1971, 94 (03) :463-+

[2] MEASUREMENTS OF ALPHA-PARTICLE-INDUCED CHARGE IN GAAS DEVICES [J].

HOPKINS, MA ;

SROUR, JR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4457-4463

[3] A FIELD-FUNNELING EFFECT ON THE COLLECTION OF ALPHA-PARTICLE-GENERATED CARRIERS IN SILICON DEVICES [J].

HSIEH, CM ;

MURLEY, PC ;

OBRIEN, RR .

ELECTRON DEVICE LETTERS, 1981, 2 (04) :103-105

[4]

HSIEH CM, 1981, APR P IEEE INT REL P, P38

[5]

HU C, 1982, IEEE ELECTRON DEVICE, V3, P31

[6] ALPHA-PARTICLE-INDUCED SOFT ERRORS IN DYNAMIC MEMORIES [J].

MAY, TC ;

WOODS, MH .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) :2-9

[7] ELECTRON MULTIPLICATION IN SILICON AND GERMANIUM [J].

MCKAY, KG ;

MCAFEE, KB .

PHYSICAL REVIEW, 1953, 91 (05) :1079-1084

[8]

MCLEAN FB, 1982, IEEE T NUCL SCI, V29, P2018

[9] COLLECTION OF CHARGE ON JUNCTION NODES FROM ION TRACKS [J].

MESSENGER, GC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2024-2031

[10] CHARGE COLLECTION MEASUREMENTS FOR HEAVY-IONS INCIDENT ON N-TYPE AND P-TYPE SILICON [J].

OLDHAM, TR ;

MCLEAN, FB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4493-4500

← 1 2 →