MATERIALS CHARACTERIZATION WITH A HE+ MICROBEAM

被引：14

作者：

MORRIS, WG ^{[1
]}

BAKHRU, H ^{[1
]}

HABERL, AW ^{[1
]}

机构：

[1] SUNY ALBANY,DEPT PHYS,ALBANY,NY 12222

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 10-1卷 / MAY期

关键词：

D O I：

10.1016/0168-583X(85)90086-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：697 / 699

页数：3

共 9 条

[1] A DISCUSSION OF THE USEFULNESS OF MICROANALYSIS USING ACCELERATORS [J].

COOKSON, JA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01) :255-258

[2] USE OF FOCUSED ION-BEAMS FOR ANALYSIS [J].

COOKSON, JA ;

PILLING, FD .

THIN SOLID FILMS, 1973, 19 (02) :381-385

[3]

DOYLE BL, 1981, MICROBEAM ANAL, P79

[4] PROTON AND NUCLEAR MICRO-PROBE DEVELOPMENTS [J].

LEGGE, GJF .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01) :243-253

[5] ACHROMATIC PROTON MICROBEAMS [J].

MARTIN, FW ;

GOLOSKIE, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01) :111-116

[6] AN ACHROMATIC QUADRUPOLE LENS DOUBLET FOR POSITIVE-IONS [J].

MARTIN, FW ;

GOLOSKIE, R .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :191-193

[7] RBS ANALYSIS WITH A 1-MU BEAM [J].

MORRIS, WG ;

KATZ, W ;

BAKHRU, H ;

HABERL, AW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01) :391-394

[8]

MORRIS WG, 1984, MICROBEAM ANAL, P327

[9] HIGH-ENERGY ION MICROPROBES [J].

NOBILING, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :197-202

← 1 →