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STRUCTURAL DISORDER OF SI(111) SQUARE ROOT 3X SQUARE ROOT 3-AU SURFACE STUDIED BY LEED
被引:42
作者
:
HIGASHIYAMA, K
论文数:
0
引用数:
0
h-index:
0
HIGASHIYAMA, K
KONO, S
论文数:
0
引用数:
0
h-index:
0
KONO, S
SAGAWA, T
论文数:
0
引用数:
0
h-index:
0
SAGAWA, T
机构
:
来源
:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
|
1986年
/ 25卷
/ 02期
关键词
:
D O I
:
10.1143/JJAP.25.L117
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:L117 / L120
页数:4
相关论文
共 12 条
[1]
SILICON CLEANING WITH HYDROGEN PEROXIDE SOLUTIONS - HIGH ENERGY ELECTRON DIFFRACTION AND AUGER ELECTRON SPECTROSCOPY STUDY
HENDERSON, RC
论文数:
0
引用数:
0
h-index:
0
HENDERSON, RC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(06)
: 772
-
+
[2]
DEFECTS AT SEMICONDUCTOR SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
HENZLER, M
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 963
-
976
[3]
OBSERVATION OF SI(111) AND GOLD-DEPOSITED SI(111) SURFACES USING MICRO-PROBE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION
ICHIKAWA, M
论文数:
0
引用数:
0
h-index:
0
ICHIKAWA, M
DOI, T
论文数:
0
引用数:
0
h-index:
0
DOI, T
HAYAKAWA, K
论文数:
0
引用数:
0
h-index:
0
HAYAKAWA, K
[J].
SURFACE SCIENCE,
1985,
159
(01)
: 133
-
148
[4]
SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES
INO, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,IRON STEEL & MET RES INST,SENDAI,MIYAGI 980,JAPAN
TOHOKU UNIV,IRON STEEL & MET RES INST,SENDAI,MIYAGI 980,JAPAN
INO, S
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1977,
16
(06)
: 891
-
908
[5]
INO S, 1982, BUTSURI, V37, P82
[6]
AES STUDY OF VERY 1ST STAGES OF CONDENSATION OF GOLD-FILMS ON SILICON(111) SURFACES
LELAY, G
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
LELAY, G
FAURIE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
FAURIE, JP
[J].
SURFACE SCIENCE,
1977,
69
(01)
: 295
-
300
[7]
PHYSICS AND ELECTRONICS OF THE NOBLE-METAL ELEMENTAL-SEMICONDUCTOR INTERFACE FORMATION - A STATUS-REPORT
LELAY, G
论文数:
0
引用数:
0
h-index:
0
LELAY, G
[J].
SURFACE SCIENCE,
1983,
132
(1-3)
: 169
-
204
[8]
REFLECTION ELECTRON-MICROSCOPY OF CLEAN AND GOLD DEPOSITED (111) SILICON SURFACES
OSAKABE, N
论文数:
0
引用数:
0
h-index:
0
OSAKABE, N
TANISHIRO, Y
论文数:
0
引用数:
0
h-index:
0
TANISHIRO, Y
YAGI, K
论文数:
0
引用数:
0
h-index:
0
YAGI, K
HONJO, G
论文数:
0
引用数:
0
h-index:
0
HONJO, G
[J].
SURFACE SCIENCE,
1980,
97
(2-3)
: 393
-
408
[9]
REAL-SPACE DETERMINATION OF ATOMIC-STRUCTURE OF THE SI(111)-SQUARE-ROOT-3 X SQUARE-ROOT-3 R 30-DEGREES-AU SURFACE BY LOW-ENERGY ALKALI-ION SCATTERING
OURA, K
论文数:
0
引用数:
0
h-index:
0
OURA, K
KATAYAMA, M
论文数:
0
引用数:
0
h-index:
0
KATAYAMA, M
SHOJI, F
论文数:
0
引用数:
0
h-index:
0
SHOJI, F
HANAWA, T
论文数:
0
引用数:
0
h-index:
0
HANAWA, T
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(14)
: 1486
-
1489
[10]
AU/SI(111) OVERLAYER - CHARACTERIZATION BY TUNNELING MICROSCOPY AND SPECTROSCOPY
SALVAN, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
SALVAN, F
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
FUCHS, H
BARATOFF, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
BARATOFF, A
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
BINNIG, G
[J].
SURFACE SCIENCE,
1985,
162
(1-3)
: 634
-
639
←
1
2
→
共 12 条
[1]
SILICON CLEANING WITH HYDROGEN PEROXIDE SOLUTIONS - HIGH ENERGY ELECTRON DIFFRACTION AND AUGER ELECTRON SPECTROSCOPY STUDY
HENDERSON, RC
论文数:
0
引用数:
0
h-index:
0
HENDERSON, RC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(06)
: 772
-
+
[2]
DEFECTS AT SEMICONDUCTOR SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
HENZLER, M
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 963
-
976
[3]
OBSERVATION OF SI(111) AND GOLD-DEPOSITED SI(111) SURFACES USING MICRO-PROBE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION
ICHIKAWA, M
论文数:
0
引用数:
0
h-index:
0
ICHIKAWA, M
DOI, T
论文数:
0
引用数:
0
h-index:
0
DOI, T
HAYAKAWA, K
论文数:
0
引用数:
0
h-index:
0
HAYAKAWA, K
[J].
SURFACE SCIENCE,
1985,
159
(01)
: 133
-
148
[4]
SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES
INO, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOHOKU UNIV,IRON STEEL & MET RES INST,SENDAI,MIYAGI 980,JAPAN
TOHOKU UNIV,IRON STEEL & MET RES INST,SENDAI,MIYAGI 980,JAPAN
INO, S
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1977,
16
(06)
: 891
-
908
[5]
INO S, 1982, BUTSURI, V37, P82
[6]
AES STUDY OF VERY 1ST STAGES OF CONDENSATION OF GOLD-FILMS ON SILICON(111) SURFACES
LELAY, G
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
LELAY, G
FAURIE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
CNRS,CTR MECANISMES CROISSANCE CRISTALLINE,CTR ST JEROME,F-13397 MARSEILLE 4,FRANCE
FAURIE, JP
[J].
SURFACE SCIENCE,
1977,
69
(01)
: 295
-
300
[7]
PHYSICS AND ELECTRONICS OF THE NOBLE-METAL ELEMENTAL-SEMICONDUCTOR INTERFACE FORMATION - A STATUS-REPORT
LELAY, G
论文数:
0
引用数:
0
h-index:
0
LELAY, G
[J].
SURFACE SCIENCE,
1983,
132
(1-3)
: 169
-
204
[8]
REFLECTION ELECTRON-MICROSCOPY OF CLEAN AND GOLD DEPOSITED (111) SILICON SURFACES
OSAKABE, N
论文数:
0
引用数:
0
h-index:
0
OSAKABE, N
TANISHIRO, Y
论文数:
0
引用数:
0
h-index:
0
TANISHIRO, Y
YAGI, K
论文数:
0
引用数:
0
h-index:
0
YAGI, K
HONJO, G
论文数:
0
引用数:
0
h-index:
0
HONJO, G
[J].
SURFACE SCIENCE,
1980,
97
(2-3)
: 393
-
408
[9]
REAL-SPACE DETERMINATION OF ATOMIC-STRUCTURE OF THE SI(111)-SQUARE-ROOT-3 X SQUARE-ROOT-3 R 30-DEGREES-AU SURFACE BY LOW-ENERGY ALKALI-ION SCATTERING
OURA, K
论文数:
0
引用数:
0
h-index:
0
OURA, K
KATAYAMA, M
论文数:
0
引用数:
0
h-index:
0
KATAYAMA, M
SHOJI, F
论文数:
0
引用数:
0
h-index:
0
SHOJI, F
HANAWA, T
论文数:
0
引用数:
0
h-index:
0
HANAWA, T
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(14)
: 1486
-
1489
[10]
AU/SI(111) OVERLAYER - CHARACTERIZATION BY TUNNELING MICROSCOPY AND SPECTROSCOPY
SALVAN, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
SALVAN, F
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
FUCHS, H
BARATOFF, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
BARATOFF, A
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
BINNIG, G
[J].
SURFACE SCIENCE,
1985,
162
(1-3)
: 634
-
639
←
1
2
→