ION SOURCES FOR ION-BEAM ASSISTED THIN-FILM DEPOSITION

被引:41
作者
ENSINGER, W
机构
[1] Universität Heidelberg, Institut für Physikalische Chemie, 6900 Heidelberg
关键词
D O I
10.1063/1.1143432
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ion beam assisted deposition (IBAD) is a coating technique which combines a thin-film deposition method such as evaporation with irradiation by highly energetic ions from an ion source. Application of an ion source and a vapor source which are operated independently of each other render the IBAD technique highly controllable, reproducible, and flexible. Ion flux, atom flux, ion energy, ion impact angle, and other parameters can be controlled independently over a wide range. In order to take advantage of the beneficial features of this technique and obtain optimum process conditions ion sources with special properties are required. In this article different ion source types and equipment which has been used for IBAD to-date are presented and their special features discussed. Ion sources which should be applicable for IBAD are described. Finally, general requirements of IBAD ion sources are discussed.
引用
收藏
页码:5217 / 5233
页数:17
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共 116 条
[61]  
KOBS K, 1988, COMMUNICATION
[62]  
KOCH J, 1958, ELECTROMAGNETIC ISOT
[63]   ABSORPTION OF ELECTROMAGNETIC-WAVES IN A RADIALLY INHOMOGENEOUS PLASMA AT HIGH MAGNETIC-FIELDS [J].
KOPECKY, V ;
MUSIL, J ;
ZACEK, F .
PLASMA PHYSICS AND CONTROLLED FUSION, 1975, 17 (12) :1147-&
[64]   ACTIVATED REACTIVE EVAPORATION OF TIO2 LAYERS AND THEIR ABSORPTION INDEXES [J].
KUSTER, H ;
EBERT, J .
THIN SOLID FILMS, 1980, 70 (01) :43-47
[65]  
MARTIN PJ, 1986, PROG OPTICS, V23, P113
[66]   ION-BASED METHODS FOR OPTICAL THIN-FILM DEPOSITION [J].
MARTIN, PJ .
JOURNAL OF MATERIALS SCIENCE, 1986, 21 (01) :1-25
[67]   DEVELOPMENT OF OXYGEN ION-SOURCE WITH MICROWAVE PLASMA CATHODE [J].
MATSUBARA, Y ;
TAHARA, H ;
TAKAHASHI, M ;
NOGAWA, S ;
ISHIKAWA, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (04) :2595-2597
[68]  
Matsuda K., 1983, Proceedings of the International Ion Engineering Congress. The 7th Symposium (1983 International) on Ion Sources and Ion Assisted Technology (ISIAT '83) and the 4th International Conference on Ion and Plasma Assisted Techniques (IPAT '83), P717
[69]   ION SPECIES MEASUREMENT OF HIGH-CURRENT METAL-ION BEAMS EXTRACTED FROM A MULTICUSP ION-SOURCE [J].
MATSUDA, Y ;
INAMI, H ;
YAMASHITA, T ;
FUJIWARA, S ;
INOUCHI, Y ;
MATSUNAGA, K ;
MATSUDA, K .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (04) :2481-2483
[70]   ION-ASSISTED DEPOSITION OF OPTICAL THIN-FILMS - LOW-ENERGY VS HIGH-ENERGY BOMBARDMENT [J].
MCNEIL, JR ;
BARRON, AC ;
WILSON, SR ;
HERRMANN, WC .
APPLIED OPTICS, 1984, 23 (04) :552-559