ELECTRON HOLOGRAPHY IN THE STUDY OF THE LEAKAGE FIELD OF MAGNETIC FORCE MICROSCOPE SENSOR TIPS

被引:12
作者
MATTEUCCI, G [1 ]
MUCCINI, M [1 ]
HARTMANN, U [1 ]
机构
[1] FORSCHUNGSZENTRUM JULICH, INST THIN FILM & ION TECHNOL, W-5170 JULICH 1, GERMANY
关键词
D O I
10.1063/1.109566
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron holography is applied to the investigation of the leakage magnetic field produced by sharp ferromagnetic probes employed for magnetic force microscopy. Using the double exposure technique, interference fringes were obtained which show a good qualitative agreement with calculations based on a macroscopic dipole model for the sensor tips. Magnetic flux measurements are possible through the evaluation of the phase difference in the simulated map of the dipole field.
引用
收藏
页码:1839 / 1841
页数:3
相关论文
共 20 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   ELECTRON HOLOGRAPHIC OBSERVATIONS OF THE ELECTROSTATIC-FIELD ASSOCIATED WITH THIN REVERSE-BIASED P-N-JUNCTIONS [J].
FRABBONI, S ;
MATTEUCCI, G ;
POZZI, G ;
VANZI, M .
PHYSICAL REVIEW LETTERS, 1985, 55 (20) :2196-2199
[3]  
GODDENHENRICH T, 1988, J MICROSC-OXFORD, V152, P527
[4]   MAGNETIC FORCE MICROSCOPY - SOME REMARKS FROM THE MICROMAGNETIC POINT OF VIEW [J].
HARTMANN, U .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1561-1564
[5]   MAGNETIC FORCE MICROSCOPY - CURRENT STATUS AND FUTURE-TRENDS [J].
HARTMANN, U ;
GODDENHENRICH, T ;
HEIDEN, C .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1991, 101 (1-3) :263-270
[6]   THEORY OF MAGNETIC FORCE MICROSCOPY [J].
HARTMANN, U .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1990, 8 (01) :411-415
[7]   IMPROVED MICROTIPS FOR SCANNING PROBE MICROSCOPY [J].
LEMKE, H ;
GODDENHENRICH, T ;
BOCHEM, HP ;
HARTMANN, U ;
HEIDEN, C .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (10) :2538-2541
[8]  
LICHTE H, 1991, ADV OPT ELECTRON MIC, V12, P25
[9]   MAGNETIC FORCE MICROSCOPY OF THIN PERMALLOY-FILMS [J].
MAMIN, HJ ;
RUGAR, D ;
STERN, JE ;
FONTANA, RE ;
KASIRAJ, P .
APPLIED PHYSICS LETTERS, 1989, 55 (03) :318-320
[10]   MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].
MARTIN, Y ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457