CONDUCTANCE STATISTICS OF SMALL-AREA OHMIC CONTACTS ON GAAS

被引:7
作者
BLANC, N
GUERET, P
BUCHMANN, P
DATWYLER, K
VETTIGER, P
机构
[1] IBM Research Division, Zurich Research Laboratory
关键词
D O I
10.1063/1.102971
中图分类号
O59 [应用物理学];
学科分类号
摘要
The conductance distributions of very small-area alloyed ohmic contacts on n+-GaAs have been studied as a function of lateral contact size d, with d ranging from 4 μm down to 0.3 μm. The data are fairly well represented by a Poisson distribution, which takes into account the granularity of the alloyed contacts, as previously reported. We deduce an average distance of dc ≃0.41 μm between conducting grains and a dead zone of ld ≃600 Å due to dry etching of the GaAs.
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页码:2216 / 2218
页数:3
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