RAMAN ANALYSIS OF LIGHT-EMITTING POROUS SILICON

被引：303

作者：

SUI, ZF

LEONG, PP

HERMAN, IP

HIGASHI, GS

TEMKIN, H

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

[2] COLUMBIA UNIV,MICROELECTR SCI LAB,NEW YORK,NY 10027

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 17期

关键词：

D O I：

10.1063/1.107097

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Porous silicon that strongly emits in the visible was analyzed using Raman scattering. The spectrum peaks near 508 cm-1, has a width of approximately 40 cm-1, and is very asymmetric. Using a model of phonon confinement, this suggests that the local structure of porous silicon is more like a sphere than a rod and has a characteristic diameter of 2.5-3.0 nm. Polarization Raman measurements suggest that the structure does not consist of a series of parallel columns.

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页码：2086 / 2088

页数：3

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