QUANTIZED HALL RESISTANCE MEASUREMENTS

被引:22
作者
KAWAJI, S
NAGASHIMA, N
KIKUCHI, N
WAKABAYASHI, J
RICKETTS, BW
YOSHIHIRO, K
KINOSHITA, J
INAGAKI, K
YAMANOUCHI, C
机构
[1] CSIRO,DIV APPL PHYS,NATL MEASUREMENT LAB,SYDNEY,NSW 2070,AUSTRALIA
[2] ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1109/19.192286
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:270 / 275
页数:6
相关论文
共 16 条
[1]  
DELAYAHE F, COMMUNICATION
[2]   THE RELATIONSHIP BETWEEN THE SI OHM, THE OHM AT NPL, AND THE QUANTIZED HALL RESISTANCE [J].
HARTLAND, A ;
JONES, RG ;
KIBBLE, BP ;
LEGG, DJ .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :208-213
[3]   SELF-BALANCING RESISTANCE RATIO BRIDGE USING A CRYOGENIC CURRENT COMPARATOR [J].
KINOSHITA, J ;
INAGAKI, K ;
YAMANOUCHI, C ;
YOSHIHIRO, K ;
KAWAJI, S ;
NAGASHIMA, N ;
KIKUCHI, N ;
WAKABAYASHI, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :290-292
[4]  
KINOSHITA J, 1987, 2ND P INT S F QUANT, P150
[6]   QUANTIZED HALL RESISTANCE MEASUREMENT AT THE NML [J].
RICKETTS, BW ;
CAGE, ME .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :245-248
[7]   THE QUANTUM HALL-EFFECT AS A STANDARD TO DEFINE THE LABORATORY UNIT OF RESISTANCE [J].
SCHWITZ, W ;
BAUDER, L ;
BUHLMANN, HJ ;
PY, MA ;
ILEGEMS, M .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :240-244
[8]   DIRECT COMPARISON OF QUANTIZED HALL RESISTANCE BETWEEN SI-MOSFET AND GAAS/ALGAAS HETEROSTRUCTURE DEVICES ON THE SAME SAMPLE HOLDER [J].
SHIDA, K ;
WADA, T ;
NISHINAKA, H ;
IGARASHI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (01) :L63-L65
[10]   20 YEARS OF SI OHM DETERMINATIONS AT NML [J].
SMALL, GW .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :190-195