THE QUANTUM HALL-EFFECT AS A STANDARD TO DEFINE THE LABORATORY UNIT OF RESISTANCE

被引：7

作者：

SCHWITZ, W ^{[1
]}

BAUDER, L ^{[1
]}

BUHLMANN, HJ ^{[1
]}

PY, MA ^{[1
]}

ILEGEMS, M ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL,INST MICROELECTR,CH-1015 LAUSANNE,SWITZERLAND

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1109/TIM.1987.6312677

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：240 / 244

页数：5

共 9 条

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[9] THE REALIZATION OF THE QUANTUM HALL STANDARD OF RESISTANCE AT THE BIPM [J].

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