PROGRAMMED ALGORITHMS TO COMPUTE TESTS TO DETECT AND DISTINGUISH BETWEEN FAILURES IN LOGIC CIRCUITS

被引：163

作者：

ROTH, JP

BOURICIUS, WG

SCHNEIDER, PR

机构：

来源：

IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS | 1967年 / EC16卷 / 05期

关键词：

D O I：

10.1109/PGEC.1967.264743

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：567 / +

页数：1

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[6] TECHNIQUES FOR DIAGNOSIS OF SWITCHING CIRCUIT FAILURES [J].

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[9]

MALING K, 1963, IEEE T ELECTRONIC CO, VEC12, P887

[10]

Miller R., 1965, SWITCHING THEORY, V1

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