CHARACTERIZATION OF CONTAMINATION LAYERS BY EMISSION ANGLE DEPENDENT XPS WITH A DOUBLE-PASS CMA

被引：27

作者：

HOFMANN, S

SANZ, JM

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1984年 / 6卷 / 02期

关键词：

D O I：

10.1002/sia.740060207

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：75 / 77

页数：3

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