FABRICATION AND CHARACTERIZATION OF DIRECT SCHOTTKY CONTACTS TO 2-DIMENSIONAL ELECTRON-GAS IN GAAS/ALGAAS QUANTUM-WELLS

被引:5
作者
SCHWEEGER, G [1 ]
HASEGAWA, H [1 ]
HARTNAGEL, HL [1 ]
机构
[1] HOKKAIDO UNIV,INTERFACE QUANTUM ELECTR RES CTR,KITA KU,SAPPORO,HOKKAIDO 060,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 1B期
关键词
2-DIMENSIONAL ELECTRON GAS; SCHOTTKY CONTACT; ELECTROPLATING; IN-SITU ELECTROLYTICAL ETCHING; CURRENT-VOLTAGE CHARACTERISTICS; CAPACITANCE-VOLTAGE CHARACTERISTICS;
D O I
10.1143/JJAP.33.779
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pt Schottky contacts to the edge of a two-dimensional electron gas in a GaAs/AlGaAs system have been manufactured using a newly developed in-situ etching and electroplating technology. The electroplating takes place selectively on the edge of the quantum well. It is shown that the in-situ etching prior to deposition leads to more uniform electroplating due to the removal of native oxides. I-V and C-V measurements have been made in order to compare the diodes with conventional Schottky diodes. It can be shown that the capacitance shows functionally the relationship predicted by theory, which demonstrates that we have manufactured a contact to a 2-dimensional electron gas. I-V measurements at low temperatures reveal parallel ohmic conductance. It is shown qualitatively that tunneling through the extremely thin barrier plays an important role in the current conduction, which explains the high ideality factor and the low apparent barrier height compared to bulk Schottky diodes.
引用
收藏
页码:779 / 785
页数:7
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