TUNNELING MICROSCOPY OF STEPS ON VICINAL GE(001) AND SI(001) SURFACES

被引：53

作者：

GRIFFITH, JE

KUBBY, JA

WIERENGA, PE

BECKER, RS

VICKERS, JS

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575366

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：493 / 496

页数：4

相关论文

共 20 条

[1] BIATOMIC STEPS ON (001) SILICON SURFACES
ASPNES, DE
IHM, J
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (24) : 3054 - 3057
[2] TUNNELING IMAGES OF ATOMIC STEPS ON THE SI(111)7X7 SURFACE
BECKER, RS
GOLOVCHENKO, JA
MCRAE, EG
SWARTZENTRUBER, BS
[J]. PHYSICAL REVIEW LETTERS, 1985, 55 (19) : 2028 - 2031
[3] SCANNING TUNNELING MICROSCOPY ON SI(112)
BERGHAUS, T
BRODDE, A
NEDDERMEYER, H
TOSCH, S
[J]. SURFACE SCIENCE, 1987, 184 (1-2) : 273 - 288
[4] BINNIG GK, 1984, SURF SCI, V144, P321, DOI 10.1016/0039-6028(84)90104-3
[5] ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES
CHADI, DJ
[J]. PHYSICAL REVIEW LETTERS, 1979, 43 (01) : 43 - 47
[6] STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES
CHADI, DJ
[J]. PHYSICAL REVIEW LETTERS, 1987, 59 (15) : 1691 - 1694
[7] FEENSTRA RM, 1987, J VAC SCI TECHNOL A, V5, P838
[8] GAVRILYUK JL, 1981, KRISTALLOGRAFIYA, V26, P561
[9] SCANNING TUNNELING MICROSCOPY OF SI(001)
HAMERS, RJ
TROMP, RM
DEMUTH, JE
[J]. PHYSICAL REVIEW B, 1986, 34 (08): : 5343 - 5357
[10] STRUCTURAL AND ELECTRONIC PROPERTIES OF STEPPED SEMICONDUCTOR SURFACES
HENZLER, M
CLABES, J
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 389 - 396