STRUCTURE AND DENSITY OF SPUTTERED MOS2-FILMS

[1] MORPHOLOGICAL PROPERTIES OF SPUTTERED MOS2 FILMS [J]. WEAR, 1983, 91 (03) : 281 - 288

[2] BUCK V, 1984, VAKUUM-TECH, V33, P206

[3] BUCK V, 1984, VERHANDL DTSCH PHYSI, V19, P99

[4] SPUTTERED MOS2 LUBRICANT COATING IMPROVEMENTS [J]. THIN SOLID FILMS, 1980, 73 (02) : 299 - 307

[5] DIMIGEN H, 1985, THIN SOLID FILMS, V124, P79

[6] EFFECTS OF CRYSTALLITE ORIENTATION ON ENVIRONMENTAL STABILITY AND LUBRICATION PROPERTIES OF SPUTTERED MOS2 THIN-FILMS [J]. ASLE TRANSACTIONS, 1984, 27 (01): : 82 - 88

[7] MEASUREMENT OF THIN FILM THICKNESSES IN NORMALLY INACCESSIBLE LOCATIONS WITH SCANNING ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (06) : 824 - &

[8] GRAY DE, 1972, AM I PHYSICS HDB, P9

[9] LANSDOWN AR, 1976, ESA CR764

[10] LANSDOWN AR, 1974, ESRO CR402

[1] MORPHOLOGICAL PROPERTIES OF SPUTTERED MOS2 FILMS [J]. WEAR, 1983, 91 (03) : 281 - 288

[2] BUCK V, 1984, VAKUUM-TECH, V33, P206

[3] BUCK V, 1984, VERHANDL DTSCH PHYSI, V19, P99

[4] SPUTTERED MOS2 LUBRICANT COATING IMPROVEMENTS [J]. THIN SOLID FILMS, 1980, 73 (02) : 299 - 307

[5] DIMIGEN H, 1985, THIN SOLID FILMS, V124, P79

[6] EFFECTS OF CRYSTALLITE ORIENTATION ON ENVIRONMENTAL STABILITY AND LUBRICATION PROPERTIES OF SPUTTERED MOS2 THIN-FILMS [J]. ASLE TRANSACTIONS, 1984, 27 (01): : 82 - 88

[7] MEASUREMENT OF THIN FILM THICKNESSES IN NORMALLY INACCESSIBLE LOCATIONS WITH SCANNING ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (06) : 824 - &

[8] GRAY DE, 1972, AM I PHYSICS HDB, P9

[9] LANSDOWN AR, 1976, ESA CR764

[10] LANSDOWN AR, 1974, ESRO CR402