CHARACTERIZATION OF A RANGE OF ALKYL-BONDED SILICA HPLC STATIONARY PHASES - XPS AND TOF-SIMS STUDIES

被引:20
作者
BROWN, VA
BARRETT, DA
SHAW, PN
DAVIES, MC
RITCHIE, HJ
ROSS, P
PAUL, AJ
WATTS, JF
机构
[1] SHANDON SCI LTD,RUNCORN WA7 1PR,CHESHIRE,ENGLAND
[2] CSMA LTD,MANCHESTER M1 7ED,ENGLAND
[3] UNIV SURREY,DEPT MAT SCI & ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
关键词
D O I
10.1002/sia.740210502
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A series of alkyl-bonded silica HPLC stationary phases with a mean particle diameter of 5 mum has been prepared using a variety of dimethylalkylsilyl chlorides (i.e. monofunctional bonding agents) with alkyl chain lengths varying from Cl to C18, including phenyl and cyanopropyl groups. The stationary phases have been characterized using XPS and time-of-flight (ToF)-SIMS. Elemental analyses by XPS have identified trace quantities of iron, sodium and chlorine at the silica/dimethylalkylsilyl chain interface, and aluminium was detected by ToF-SIMS. A comparison of percentage carbon obtained by XPS with bulk carbon-loading analyses suggests that the alkyl chains are bonded to the surface of the porous silica particles. Molecular ions characteristic of the dimethylalkylsilyl groups were identified in the ToF-SIMS data together with ions attributable to these alkylsilyl groups attached to fragments of silica, the latter indicating covalent bonding to the silica surface. In addition, a series of low-mass signals corresponding to alkyl chain fragments and silyl/silica-based ions was observed. The value of high-resolution ToF-SIMS data for ion assignments is well demonstrated. The relative ion intensities of several of these low-mass ions were studied as a function of changing alkyl chain length. In general, as the alkyl chain length increased, the abundance of the silicon-containing fragments decreased, whilst the abundance of the alkyl-based fragments increased, within the ToF-SIMS spectra.
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页码:263 / 273
页数:11
相关论文
共 37 条
[1]   CHARACTERIZATION OF BONDED PHASES BY SOLID-STATE NMR-SPECTROSCOPY [J].
ALBERT, K ;
BAYER, E .
JOURNAL OF CHROMATOGRAPHY, 1991, 544 (1-2) :345-370
[2]  
BRIGGS D, 1988, POLYM COMMUN, V29, P6
[3]   RECENT ADVANCES IN SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR POLYMER SURFACE-ANALYSIS [J].
BRIGGS, D .
BRITISH POLYMER JOURNAL, 1989, 21 (01) :3-15
[4]   INTERACTION OF ION-BEAMS WITH POLYMERS, WITH PARTICULAR REFERENCE TO SIMS [J].
BRIGGS, D ;
HEARN, MJ .
VACUUM, 1986, 36 (11-12) :1005-1010
[5]  
BRIGGS D, 1990, PRACTICAL SURFACE AN, V1, P443
[6]  
BUDZIKIEWICZ H, 1964, INTERPRETATION MASS, P111
[7]   CHARACTERIZATION OF C-18 CHEMICALLY MODIFIED SILICA-GEL AND POROUS-GLASS PHASES BY HIGH-RESOLUTION SOLID-STATE NMR-SPECTROSCOPY AND OTHER PHYSICOCHEMICAL METHODS [J].
BUSZEWSKI, B .
CHROMATOGRAPHIA, 1990, 29 (5-6) :233-242
[8]  
CARLEY AF, 1980, FARADAY DISCUSS CHEM, V15, P39
[9]   CHARACTERIZATION OF MODIFIED SILICA POWDERS BY FOURIER-TRANSFORM INFRARED-SPECTROSCOPY AND CROSS-POLARIZATION MAGIC ANGLE SPINNING NMR [J].
DEHAAN, JW ;
VANDENBOGAERT, HM ;
PONJEE, JJ ;
VANDEVEN, LJM .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1986, 110 (02) :591-600
[10]   THE CHARACTERIZATION OF AN IMAGING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY INSTRUMENT [J].
ECCLES, AJ ;
VICKERMAN, JC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (02) :234-244