ANOMALOUSLY LARGE CHANGES IN DIFFRACTED X-RAY-INTENSITY FROM SILICON SINGLE-CRYSTALS PRODUCED BY MICROWAVE FIELDS

被引：4

作者：

LAL, K ^{[1
]}

THOMA, P ^{[1
]}

机构：

[1] PHYS TECH BUNDESANSTALT,D-3300 BRUNSWICK,FED REP GER

来源：

关键词：

D O I：

10.1016/0038-1098(85)90105-X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：107 / 110

页数：4

共 11 条

[1]

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[2]

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LAL, K ;

MADER, S .

[4]

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LAL, K ;

THOMA, P .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 80 (02) :491-502

[6]

LAL K, 1984, ACTA CRYST A, V40

[7]

LAL K, 1981, ACTA CRYSTALLOGR A, V37, pC262

[8]

LAL K, 1982, SYNTHESIS CRYSTAL GR, P287

[9]

Penning P., 1961, PHILIPS RES REP, V16, P419

[10]

SCHWUTTKE GH, 1969, J APPL PHYS, V39, P1581