EXTENDED X-RAY ISOCHROMAT FINE-STRUCTURE OF CU

被引：29

作者：

SPEIER, W ^{[1
]}

HAYES, TM ^{[1
]}

ALLEN, JW ^{[1
]}

BOYCE, JB ^{[1
]}

FUGGLE, JC ^{[1
]}

CAMPAGNA, M ^{[1
]}

机构：

[1] XEROX CORP, PALO ALTO RES CTR, PALO ALTO, CA 94304 USA

来源：

PHYSICAL REVIEW LETTERS | 1985年 / 55卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.55.1693

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1693 / 1696

页数：4

共 19 条

[1] LARGE FERMI-LEVEL RESONANCE IN THE ELECTRON-ADDITION SPECTRUM OF CERU2 AND CEIR2 [J].

ALLEN, JW ;

OH, SJ ;

MAPLE, MB ;

TORIKACHVILI, MS .

PHYSICAL REVIEW B, 1983, 28 (09) :5347-5349

[2] HIGH-ENERGY SPECTROSCOPIC STUDY OF THE OCCUPIED AND UNOCCUPIED 5F AND VALENCE STATES IN TH AND U METALS [J].

BAER, Y ;

LANG, JK .

PHYSICAL REVIEW B, 1980, 21 (06) :2060-2062

[3]

BETHE HA, 1957, QUANTUM MECHANICS ON

[4] INVESTIGATION OF INTRINSIC UNOCCUPIED SURFACE-STATES AT GAAS(110) BY ISOCHROMAT SPECTROSCOPY [J].

DOSE, V ;

GOSSMANN, HJ ;

STRAUB, D .

PHYSICAL REVIEW LETTERS, 1981, 47 (08) :608-610

[5]

HAYES TM, 1982, SOLID STATE PHYS, V37, P173

[6] TRANSITION TO NONMAGNETIC F-STATES IN CE INTERMETALLIC COMPOUNDS STUDIED BY BREMSSTRAHLUNG ISOCHROMAT SPECTROSCOPY [J].

HILLEBRECHT, FU ;

FUGGLE, JC ;

SAWATZKY, GA ;

CAMPAGNA, M ;

GUNNARSSON, O ;

SCHONHAMMER, K .

PHYSICAL REVIEW B, 1984, 30 (04) :1777-1787

[7] CONDUCTION-BAND DENSITY OF STATES IN HYDROGENATED AMORPHOUS-SILICON DETERMINED BY INVERSE PHOTOEMISSION [J].

JACKSON, WB ;

OH, SJ ;

TSAI, CC ;

ALLEN, JW .

PHYSICAL REVIEW LETTERS, 1984, 53 (15) :1481-1484

[8] STUDY OF THE 4F AND VALENCE BAND DENSITY OF STATES IN RARE-EARTH-METALS .2. EXPERIMENT AND RESULTS [J].

LANG, JK ;

BAER, Y ;

COX, PA .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1981, 11 (01) :121-138

[9] THEORY OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE [J].

LEE, PA ;

PENDRY, JB .

PHYSICAL REVIEW B, 1975, 11 (08) :2795-2811

[10] X-RAY ABSORPTION-SPECTRA - K-EDGES OF 3D TRANSITION-METALS, L-EDGES OF 3D AND 4D METALS, AND M-EDGES OF PALLADIUM [J].

MULLER, JE ;

JEPSEN, O ;

WILKINS, JW .

SOLID STATE COMMUNICATIONS, 1982, 42 (05) :365-368

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