THE DOUBLE CRYSTAL X-RAY-CAMERA AT DARESBURY-LABORATORY

被引：17

作者：

BOWEN, DK ^{[1
]}

DAVIES, ST ^{[1
]}

机构：

[1] SCI & ENGN RES COUNCIL,DARESBURY LAB,WARRINGTON WA4 4AD,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91213-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：725 / 729

页数：5

共 15 条

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FISCHER, K .

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[3]

BONSE U, 1979, ESF STUDY EUROPEAN S, V3

[4]

Bowen D. K., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P506

[5]

BOWEN DK, 1982, NUCL INSTR METH, V195, P227

[6]

BOWN DK, 1980, ANN NEW YORK ACAD SC, V342, P22

[7]

DAVIES SG, UNPUB

[8] X-RAY OPTICS AND SPECTRAL BRIGHTNESS OF THE SUPERCONDUCTING SRS WIGGLER [J].

GREAVES, GN ;

BENNETT, R ;

DUKE, PJ ;

HOLT, R ;

SULLER, VP .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3) :139-142

[9] A DIRECT MEASUREMENT OF THE SOURCE PROFILE OF THE DARESBURY SRS [J].

HART, M ;

SIDDONS, DP .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 204 (01) :219-221

[10]

HART M, 1980, CHARACTERIZATION CRY, P241

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