NOVEL AIINAS/INP HEMT

被引:9
作者
AINA, O
SERIO, M
MATTINGLY, M
HEMPFLING, E
机构
[1] Allied-Signal Aerospace Company, Aerospace Technology Center, 9140 Old Annapolis Road
关键词
Amplifiers; Semiconductor devices and materials;
D O I
10.1049/el:19900426
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The fabrication of the first AlInAs/InP HEMT is reported. This device has extrinsic transconductance of 40mS/mm, gate-drain and drain-source breakdown voltages of 20 V and saturation drain current densities of 0-1 A/mm of gate width. These preliminary results show the potential of the AlInAs/InP heterojunctions for a wide variety of application including microwave power HEMTs. © 1990, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码:651 / 652
页数:2
相关论文
共 4 条
[1]  
AINA O, 1988, J CRYST GROWTH, V93, P911
[2]   MICROWAVE AND DC CHARACTERIZATION OF INP/GAINAS HETEROSTRUCTURE INSULATED-GATE FETS EMPLOYING AIINAS AS GATE INSULATOR [J].
MARTIN, EA ;
AINA, OA ;
MATTINGLY, MR ;
STECKER, LH ;
HEMPFLING, E ;
ILIADIS, AA .
ELECTRONICS LETTERS, 1988, 24 (19) :1242-1243
[3]   MICROWAVE PERFORMANCE OF 0.25-MU-M GATE LENGTH HIGH ELECTRON-MOBILITY TRANSISTORS [J].
MISHRA, UK ;
PALMATEER, SC ;
CHAO, PC ;
SMITH, PM ;
HWANG, JCM .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (03) :142-145
[4]   HIGH-PERFORMANCE SUBMICROMETER ALINAS-GAINAS HEMTS [J].
MISHRA, UK ;
BROWN, AS ;
JELLOIAN, LM ;
HACKETT, LH ;
DELANEY, MJ .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (01) :41-43