FABRICATION OF ULTRASMALL DEVICES ON THIN ACTIVE GAAS MEMBRANES

被引:7
作者
LEE, KY
FROST, J
STANLEY, C
PATRICK, W
MACKIE, WS
BEAUMONT, SP
WILKINSON, CDW
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 01期
关键词
D O I
10.1116/1.583893
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:322 / 325
页数:4
相关论文
共 13 条
[1]  
BEAUMONT SP, 1981, P INT C MICROLITHOGR
[2]   SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS [J].
CHANDRA, A ;
WOOD, CEC ;
WOODARD, DW ;
EASTMAN, LF .
SOLID-STATE ELECTRONICS, 1979, 22 (07) :645-650
[3]  
GRABBE P, 1983, 10TH P INT C EL ION
[4]   ELECTRONS AT A SEMICONDUCTOR HETEROJUNCTION SUBJECT TO A PERIODIC BIASING POTENTIAL [J].
KELLY, MJ .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (29) :L781-L786
[5]  
MACKIE WS, 1985, SOLID STATE TECHNOLO, V28, P117
[6]  
MACKIE WS, 1983, 10TH P INT C EL ION
[7]  
MACKIE WS, 1982, P MICROCIRCUIT ENG 8
[8]   LOW-TEMPERATURE ANNEALED CONTACTS TO VERY THIN GAAS EPILAYERS [J].
PATRICK, W ;
MACKIE, WS ;
BEAUMONT, SP ;
WILKINSON, CDW .
APPLIED PHYSICS LETTERS, 1986, 48 (15) :986-988
[9]   VERY SHORT GATE-LENGTH GAAS-MESFETS [J].
PATRICK, W ;
MACKIE, WS ;
BEAUMONT, SP ;
WILKINSON, CDW ;
OXLEY, CH .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (09) :471-472
[10]  
PATRICK W, 1985, 29TH P INT S EL ION