LOW-TEMPERATURE ANNEALED CONTACTS TO VERY THIN GAAS EPILAYERS

[1] MODELS FOR CONTACTS TO PLANAR DEVICES [J]. SOLID-STATE ELECTRONICS, 1972, 15 (02) : 145 - &

[2] OHMIC CONTACTS TO GAAS [J]. THIN SOLID FILMS, 1983, 104 (3-4) : 391 - 397

[3] SPECIFIC CONTACT RESISTANCE OF METAL-SEMICONDUCTOR BARRIERS [J]. SOLID-STATE ELECTRONICS, 1971, 14 (07) : 541 - &

[4] HOT-PLATE ALLOYING FOR OHMIC CONTACTS TO GAAS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (08) : 1100 - 1103

[5] Kellner W., 1975, Siemens Forschungs- und Entwicklungsberichte, V4, P137

[6] ELECTRON-MICROSCOPE STUDIES OF AN ALLOYED AU/NI-AU-GE OHMIC CONTACT TO GAAS [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (12) : 6952 - 6957

[7] MEASUREMENT OF CONTACT RESISTANCE BETWEEN METAL AND DIFFUSION LAYER IN SI PLANAR ELEMENTS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (11) : 879 - &

[8] NOVEL OHMIC CONTACTS TO N-TYPE GAAS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (10) : 1691 - 1692

[9] ALLOYING BEHAVIOR OF NI-AU-GE FILMS ON GAAS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) : 406 - 412

[10] OBTAINING THE SPECIFIC CONTACT RESISTANCE FROM TRANSMISSION-LINE MODEL MEASUREMENTS [J]. ELECTRON DEVICE LETTERS, 1982, 3 (05): : 111 - 113

[1] MODELS FOR CONTACTS TO PLANAR DEVICES [J]. SOLID-STATE ELECTRONICS, 1972, 15 (02) : 145 - &

[2] OHMIC CONTACTS TO GAAS [J]. THIN SOLID FILMS, 1983, 104 (3-4) : 391 - 397

[3] SPECIFIC CONTACT RESISTANCE OF METAL-SEMICONDUCTOR BARRIERS [J]. SOLID-STATE ELECTRONICS, 1971, 14 (07) : 541 - &

[4] HOT-PLATE ALLOYING FOR OHMIC CONTACTS TO GAAS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (08) : 1100 - 1103

[5] Kellner W., 1975, Siemens Forschungs- und Entwicklungsberichte, V4, P137

[6] ELECTRON-MICROSCOPE STUDIES OF AN ALLOYED AU/NI-AU-GE OHMIC CONTACT TO GAAS [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (12) : 6952 - 6957

[7] MEASUREMENT OF CONTACT RESISTANCE BETWEEN METAL AND DIFFUSION LAYER IN SI PLANAR ELEMENTS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (11) : 879 - &

[8] NOVEL OHMIC CONTACTS TO N-TYPE GAAS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (10) : 1691 - 1692

[9] ALLOYING BEHAVIOR OF NI-AU-GE FILMS ON GAAS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) : 406 - 412

[10] OBTAINING THE SPECIFIC CONTACT RESISTANCE FROM TRANSMISSION-LINE MODEL MEASUREMENTS [J]. ELECTRON DEVICE LETTERS, 1982, 3 (05): : 111 - 113