FRICTIONAL AND ATOMIC-SCALE STUDY OF C-60 THIN-FILMS BY SCANNING FORCE MICROSCOPY

被引:29
作者
LUTHI, R [1 ]
HAEFKE, H [1 ]
MEYER, E [1 ]
HOWALD, L [1 ]
LANG, HP [1 ]
GERTH, G [1 ]
GUNTHERODT, HJ [1 ]
机构
[1] MAX PLANCK INST MICROSTRUCT PHYS, D-06120 HALLE, GERMANY
来源
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1994年 / 95卷 / 01期
关键词
D O I
10.1007/BF01316835
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Scanning force microscopy (SFM) was employed to characterize C60 island films in an ultra-high vacuum (UHV). The initial growth stage of C60 on NaCl cleavage faces and nanotribological properties of this solid lubricant are investigated. In comparison to the NaCl(001) face, higher friction is measured on the C60 islands, resulting in a ratio of friction of 1:3 for NaCl:C60. The friction coefficient of the (111) oriented C60 island is determined to be 0.15+/-0.05. High-resolution SFM images reveal the hexagonal lattice of the unreconstructed (111) top surfaces and the overgrowth relationships of the C60 islands.
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页码:1 / 3
页数:3
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