ATOMIC FORCE MICROSCOPY

被引:195
作者
MEYER, E
机构
[1] Institute of Physics, University of Basel, 4056 Basel
关键词
D O I
10.1016/0079-6816(92)90009-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.
引用
收藏
页码:3 / 49
页数:47
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