TRANSITION FROM TUNNELING TO POINT CONTACT INVESTIGATED BY SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY

被引：34

作者：

GIMZEWSKI, JK

MOLLER, R

POHL, DW

SCHLITTLER, RR

机构：

来源：

SURFACE SCIENCE | 1987年 / 189卷

关键词：

D O I：

10.1016/S0039-6028(87)80409-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：15 / 23

页数：9

共 11 条

[1]

ABRAHAM D, 1986, IBM J RES DEV, V30, P493

[2]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[3] THEORY OF ADHESION AT A BIMETALLIC INTERFACE - OVERLAP EFFECTS [J].

FERRANTE, J ;

SMITH, JR .

SURFACE SCIENCE, 1973, 38 (01) :77-92

[4]

GIMZEWSKI JK, IN PRESS PHYS REV B

[5] POINT-CONTACT SPECTROSCOPY IN METALS [J].

JANSEN, AGM ;

VANGELDER, AP ;

WYDER, P .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (33) :6073-6118

[6] LITHOGRAPHY WITH THE SCANNING TUNNELING MICROSCOPE [J].

MCCORD, MA ;

PEASE, RFW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01) :86-88

[7] ADHESION AND MICROMECHANICAL PROPERTIES OF METAL-SURFACES [J].

PASHLEY, MD ;

PETHICA, JB ;

TABOR, D .

WEAR, 1984, 100 (1-3) :7-31

[8]

PETHICA J, COMMUNICATION

[9] NANOMETER LITHOGRAPHY WITH THE SCANNING TUNNELING MICROSCOPE [J].

RINGGER, M ;

HIDBER, HR ;

SCHLOGL, R ;

OELHAFEN, P ;

GUNTHERODT, HJ .

APPLIED PHYSICS LETTERS, 1985, 46 (09) :832-834

[10] ELECTRONIC-STRUCTURE OF THE SI(111)2X1 SURFACE BY SCANNING-TUNNELING MICROSCOPY [J].

STROSCIO, JA ;

FEENSTRA, RM ;

FEIN, AP .

PHYSICAL REVIEW LETTERS, 1986, 57 (20) :2579-2582

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