STRUCTURAL MORPHOLOGY AND ELECTRONIC-PROPERTIES OF THE SI-CR INTERFACE

被引：86

作者：

FRANCIOSI, A ^{[1
]}

PETERMAN, DJ ^{[1
]}

WEAVER, JH ^{[1
]}

MORUZZI, VL ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

关键词：

D O I：

10.1103/PhysRevB.25.4981

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4981 / 4993

页数：13

共 52 条

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