COMPUTER-SIMULATED SCHLIEREN OPTICS

[1] SCHLIEREN PHOTOGRAPHY - SHORT BIBLIOGRAPHY AND REVIEW [J]. OPTICS AND LASER TECHNOLOGY, 1981, 13 (01) : 37 - 42

[2] THE 1ST AND THE FINAL 50 NANOSECONDS OF A FAST FOCUS DISCHARGE [J]. PHYSICS OF FLUIDS, 1983, 26 (02) : 571 - 578

[3] DECKER G, 1985, UNPUB PLASMA PHY JAN

[4] REGULAR DENSITY STRUCTURES IN THE PLASMA-FOCUS [J]. PHYSICS LETTERS A, 1982, 88 (08) : 403 - 404

[5] INFRARED SCHLIEREN INTERFEROMETER FOR MEASURING ELECTRON-DENSITY PROFILES [J]. PLASMA PHYSICS, 1972, 14 (02): : 111 - &

[6] QUANTITATIVE SCHLIEREN TECHNIQUES APPLIED TO HIGH CURRENT ARC INVESTIGATIONS [J]. APPLIED OPTICS, 1972, 11 (08) : 1822 - +

[7] ELEKTRONENDICHTE UND TEMPERATUR IN DER SAULE DES HOCHSTROMKOHLEBOGENS [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 136 (02): : 119 - 136

[8] BEAM DEVIATION METHOD AS A DIAGNOSTIC TOOL FOR PLASMA FOCUS [J]. APPLIED OPTICS, 1978, 17 (08): : 1275 - 1279

[1] SCHLIEREN PHOTOGRAPHY - SHORT BIBLIOGRAPHY AND REVIEW [J]. OPTICS AND LASER TECHNOLOGY, 1981, 13 (01) : 37 - 42

[2] THE 1ST AND THE FINAL 50 NANOSECONDS OF A FAST FOCUS DISCHARGE [J]. PHYSICS OF FLUIDS, 1983, 26 (02) : 571 - 578

[3] DECKER G, 1985, UNPUB PLASMA PHY JAN

[4] REGULAR DENSITY STRUCTURES IN THE PLASMA-FOCUS [J]. PHYSICS LETTERS A, 1982, 88 (08) : 403 - 404

[5] INFRARED SCHLIEREN INTERFEROMETER FOR MEASURING ELECTRON-DENSITY PROFILES [J]. PLASMA PHYSICS, 1972, 14 (02): : 111 - &

[6] QUANTITATIVE SCHLIEREN TECHNIQUES APPLIED TO HIGH CURRENT ARC INVESTIGATIONS [J]. APPLIED OPTICS, 1972, 11 (08) : 1822 - +

[7] ELEKTRONENDICHTE UND TEMPERATUR IN DER SAULE DES HOCHSTROMKOHLEBOGENS [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 136 (02): : 119 - 136

[8] BEAM DEVIATION METHOD AS A DIAGNOSTIC TOOL FOR PLASMA FOCUS [J]. APPLIED OPTICS, 1978, 17 (08): : 1275 - 1279