STRAIN TRANSFER BETWEEN THIN-FILMS ON BURIED OXIDE AND ITS APPLICATION IN HETEROEPITAXIAL CRYSTAL-GROWTH

被引:12
作者
HUANG, FY
WANG, KL
机构
[1] Device Research Laboratory, Electrical Engineering Department, University of California at Los Angeles, Los Angeles, CA
关键词
D O I
10.1080/09500839508242456
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A strain transfer process between two epitaxial thin films with different lattice constants will be discussed. It is demonstrated that an epitaxial film (epifilm) grown on top of a thin buffer layer may release the strain to the buffer layer, leaving the epifilm dislocation free. A criterion to achieve this strain transfer is also derived. The strain transfer model can explain recent experiments on the growth of low dislocation relaxed SiGe material on Si. For GaAs-based materials we propose a scheme to form a thin buffer by GaAs situated on top of a buried oxide such as Al2O3 through wet oxidation of AlAs. This GaAs thin buffer provides a flexible substrate for the growth of epifilms with thicknesses not limited by conventional critical thickness for strained layers. Detailed numerical analysis on the growth of InxGa1-xAs on GaAs is also performed.
引用
收藏
页码:231 / 237
页数:7
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