AN X-RAY FOURIER LINE-SHAPE ANALYSIS OF HEXAGONAL TELLURIUM-FILMS .2. VACUUM EVAPORATED AT LOW-TEMPERATURE (133-K)

被引：2

作者：

CHATTERJEE, E

SENGUPTA, SP

机构：

来源：

THIN SOLID FILMS | 1984年 / 122卷 / 01期

关键词：

D O I：

10.1016/0040-6090(84)90380-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：73 / 91

页数：19

共 25 条

[1] STRUCTURE, GROWTH AND ORIENTATION OF VACUUM DEPOSITED TELLURIUM FILMS [J].

CAPERS, MJ ;

WHITE, M .

THIN SOLID FILMS, 1971, 8 (05) :317-&

[2]

CHAUDHURI AK, 1975, INDIAN J PURE AP PHY, V13, P646

[3]

Chopra K. L., 1969, THIN FILM PHENOMENA

[4]

CHOPRA KL, 1969, THIN FILM PHENOMENA, pCH5

[5] X RAY DETERMINATION OF THERMAL EXPANSION OF TELLURIUM [J].

DESHPAND.VT ;

PAWAR, R .

PHYSICA, 1965, 31 (05) :671-&

[6]

DUTTON RW, 1960, SOLID STATE ELECTRON, V12, P136

[7] X-RAY-DIFFRACTION PROFILE ANALYSIS OF VACUUM-EVAPORATED COPPER-FILMS - NORMAL AND OBLIQUE VAPOR INCIDENCE [J].

HALDER, SK ;

SEN, S ;

GUPTA, SPS .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (13) :1867-1879

[8]

ICHIKAWA T, 1973, PHYS STATUS SOLIDI A, V19, P707, DOI [10.1002/pssa.2210190237, 10.1002/pssb.2220560235]

[9] X-RAY-DIFFRACTOMETRY INSITU OF EVAPORATED THIN-FILMS - APPLICATION TO AMORPHOUS TELLURIUM [J].

MALAURENT, JC ;

DIXMIER, J .

THIN SOLID FILMS, 1976, 36 (02) :L1-L4

[10]

MALGRANGE L, 1963, CR ACAD SCI, V257, P2030

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