X-RAY-DIFFRACTION PROFILE ANALYSIS OF VACUUM-EVAPORATED COPPER-FILMS - NORMAL AND OBLIQUE VAPOR INCIDENCE

被引：14

作者：

HALDER, SK ^{[1
]}

SEN, S ^{[1
]}

GUPTA, SPS ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVATION SCI,DEPT GEN PHYS & X RAYS,CALCUTTA 700032,INDIA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1976年 / 9卷 / 13期

关键词：

D O I：

10.1088/0022-3727/9/13/007

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1867 / 1879

页数：13

共 19 条

[1]

Chopra K. L., 1969, THIN FILM PHENOMENA

[2] CRYSTAL GROWTH AND ORIENTATIONS IN VACUUM-CONDENSED SILVER FILMS AND THEIR SYSTEMATIC DEPENDANCE ON RESIDUAL AIR PRESSURE, FILM THICKNESS, RATE OF DEPOSITION AND SUBSTRATE TEMPERATURE [J].

DUTTA, PK ;

WILMAN, H .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (06) :839-&

[3] STRUCTURE AND GROWTH OF SILVER FILMS CONDENSED AT OBLIQUE VAPOUR INCIDENCE, AND THEIR DEPENDENCE ON FILM THICKNESS AND RESIDUAL AIR PRESSURE [J].

DUTTA, PK ;

WILMAN, H .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (12) :1971-&

[4] STRUCTURE OF ELECTROPLATED AND VAPOR-DEPOSITED COPPER FILMS [J].

GANGULEE, A .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (03) :867-+

[5] AN X-RAY STUDY OF EFFECTS OF NICKEL AND MANGANESE ON OCCURRENCE OF STACKING FAULTS IN COPPER-BASE ALLOYS [J].

GOSWAMI, KN ;

SENGUPTA, SP ;

QUADER, MA .

ACTA METALLURGICA, 1966, 14 (11) :1559-&

[6] DEVELOPMENT OF ORIENTED CRYSTAL-GROWTH DURING CONDENSATION OF GOLD, SILVER AND COPPER FILMS IN VACUUM, AND ITS SYSTEMATIC DEPENDENCE ON RESIDUAL GAS PRESSURE AND ADSORPTION, AND FILM THICKNESS, ATOMIC MOBILITY AND CHEMICAL REACTIVITY [J].

KAKATI, KK ;

WILMAN, H .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (11) :1307-&

[7] X-RAY DIFFRACTION STUDY OF VACUUM-EVAPORATED SILVER FILMS [J].

LIGHT, TB ;

WAGNER, CNJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1966, 3 (01) :1-&

[8]

ROTHMAN RL, 1969, ADV XRAY ANAL, V12, P308

[9] X-RAY LINE BROADENING ANALYSIS IN VACUUM-EVAPORATED SILVER FILMS [J].

SEN, S ;

HALDER, SK ;

SENGUPTA, SP .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1975, 38 (06) :1641-1647

[10] X-RAY LINE SHIFT ANALYSIS IN VACUUM-EVAPORATED SILVER FILMS [J].

SEN, S ;

HALDER, SK ;

SENGUPTA, SP .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (17) :1978-1985

← 1 2 →