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NEW SEMI-AUGER MICROANALYZER WITH UHV CAPABILITY
被引:5
作者
:
ISHIDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
ISHIDA, T
[
1
]
UCHIYAMA, M
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
UCHIYAMA, M
[
1
]
ODA, Z
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
ODA, Z
[
1
]
HASHIMOTO, H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
HASHIMOTO, H
[
1
]
机构
:
[1]
NIPPON ELECT VARIAN LTD,TOKYO,JAPAN
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
|
1976年
/ 13卷
/ 03期
关键词
:
D O I
:
10.1116/1.568974
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:711 / 715
页数:5
相关论文
共 8 条
[1]
AUGER ELECTRON SPECTROSCOPY
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 53
-
+
[2]
HAYAKAWA K, 1973, J APPL PHYS, V44, P2572
[3]
ION MICROPROBE MASS ANALYZER
LIEBL, H
论文数:
0
引用数:
0
h-index:
0
LIEBL, H
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(13)
: 5277
-
&
[4]
AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
MACDONALD, NC
WALDROP, JR
论文数:
0
引用数:
0
h-index:
0
WALDROP, JR
[J].
APPLIED PHYSICS LETTERS,
1971,
19
(09)
: 315
-
+
[5]
NAGASAWA Y, 1975, 36TH AUT C JAP SOC A, P272
[6]
ELECTRON PROBE MICROANALYSIS
REUTER, W
论文数:
0
引用数:
0
h-index:
0
REUTER, W
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 80
-
&
[7]
SHIMIZU H, 1974, 6TH P INT VAC C KYOT, P351
[8]
ZASHKVARA VV, 1966, SOV PHYS TECH PHYS-U, V11, P96
←
1
→
共 8 条
[1]
AUGER ELECTRON SPECTROSCOPY
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 53
-
+
[2]
HAYAKAWA K, 1973, J APPL PHYS, V44, P2572
[3]
ION MICROPROBE MASS ANALYZER
LIEBL, H
论文数:
0
引用数:
0
h-index:
0
LIEBL, H
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(13)
: 5277
-
&
[4]
AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
论文数:
0
引用数:
0
h-index:
0
MACDONALD, NC
WALDROP, JR
论文数:
0
引用数:
0
h-index:
0
WALDROP, JR
[J].
APPLIED PHYSICS LETTERS,
1971,
19
(09)
: 315
-
+
[5]
NAGASAWA Y, 1975, 36TH AUT C JAP SOC A, P272
[6]
ELECTRON PROBE MICROANALYSIS
REUTER, W
论文数:
0
引用数:
0
h-index:
0
REUTER, W
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 80
-
&
[7]
SHIMIZU H, 1974, 6TH P INT VAC C KYOT, P351
[8]
ZASHKVARA VV, 1966, SOV PHYS TECH PHYS-U, V11, P96
←
1
→