LOW-TEMPERATURE INTERDIFFUSION IN AU-PD AND AU-RH THIN-FILM COUPLES

被引：15

作者：

DEBONTE, WJ ^{[1
]}

POATE, JM ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1016/0040-6090(75)90062-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：441 / 448

页数：8

共 9 条

[1] [Anonymous], PHYS THIN FILMS
[2] BAGLIN J, 1974, APPLICATION ION BEAM, P169
[3] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS
CHU, WK
MAYER, JW
NICOLET, MA
BUCK, TM
AMSEL, G
EISEN, F
[J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41
[4] DeBonte W. J., 1974, APPLICATIONS ION BEA, P147
[5] DEBONTE WJ, TO BE PUBLISHED
[6] INTERNAL STRESSES AND INTERDIFFUSION OF TI-PD-AU FILMS STUDIED BY X-RAY-DIFFRACTION TECHNIQUES
LAU, SS
SUN, RC
[J]. THIN SOLID FILMS, 1972, 10 (02) : 273 - +
[7] Neukam O, 1970, GALVANOTECHNIK, V61, P626
[8] POATE JM, TO BE PUBLISHED
[9] WHIPPLE RTP, 1954, PHILOS MAG, V45, P1225