MAPPING OF SHORT-RANGE ADHESIVE FORCES BY SCANNING-TUNNELING-MICROSCOPY

被引：7

作者：

DURIG, U

ZUGER, O

机构：

[1] IBM Research Division, Zurich Research Laboratory

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.50.5008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Detection of short-range interactions in combination with tunneling microscopy provides a means for characterizing the chemical nature of surfaces. Results are presented that demonstrate that carbon adsorbed on a rough, polycrystalline Ir surface can be detected on an atomic level.

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页码：5008 / 5011

页数：4

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