A PHOTOEMISSION DETERMINATION OF THE BAND DIAGRAM OF THE TE/CDTE INTERFACE

被引:79
作者
NILES, DW [1 ]
LI, XN [1 ]
SHELDON, P [1 ]
HOCHST, H [1 ]
机构
[1] UNIV WISCONSIN,CTR SYNCHROTRON RADIAT,STOUGHTON,WI 53589
关键词
D O I
10.1063/1.359444
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two experiments designed to assist in understanding the physics of certain back contacts on p-type CdTe solar-cell devices are described. In the first experiment, x-ray photoelectron and Auger electron spectroscopies are used to show that etching CdTe in HNO3:H3PO4 results in a Te layer on the CdTe surface. In the second experiment, photoemission spectroscopy is used to explore the electronic properties of evaporated Te deposited on thin-film, polycrystalline p-CdTe in an effort to develop a band diagram for the Te/p-CdTe interface. The motivation for developing the band diagram derives from previous observations that chemically etching polycrystalline p-CdTe solar-cell device material before application of the back contact reduces the series resistance of the device. The key results are that the evaporated Te overlayer is p type and that the valence-band offset between Te and p-CdTe is favorable for low-series-resistance contact, ΔE v=0.26±0.1 eV. © 1995 American Institute of Physics.
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页码:4489 / 4493
页数:5
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