COSMIC-RAY SIMULATION EXPERIMENTS FOR THE STUDY OF SINGLE EVENT UPSETS AND LATCH-UP IN CMOS MEMORIES

被引：22

作者：

STEPHEN, JH ^{[1
]}

SANDERSON, TK ^{[1
]}

MAPPER, D ^{[1
]}

FARREN, J ^{[1
]}

HARBOESORENSEN, R ^{[1
]}

ADAMS, L ^{[1
]}

机构：

[1] EUROPEAN SPACE AGCY,EUROPEAN SPACE RES & TECHNOL CTR,2200 AG NOORDWIJK,NETHERLANDS

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333155

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4464 / 4469

页数：6

共 12 条

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[9] USE OF A CF-252 SOURCE IN COSMIC-RAY SIMULATION STUDIES ON CMOS MEMORIES [J].

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[10] FRAGMENT ENERGY CORRELATION MEASUREMENTS FOR 252CF SPONTANEOUS FISSION AND 235U THERMAL-NEUTRON FISSION [J].

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