LATTICE IMAGING OF SILICIDE-SILICON INTERFACES AND THE INTERPRETATION OF INTERFACIAL DEFECTS

被引：13

作者：

FOLL, H

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 69卷 / 02期

关键词：

D O I：

10.1002/pssa.2210690243

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：779 / 788

页数：10

共 21 条

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[7]

FOLL H, 1981, J APPL PHYS, V52, P5510, DOI 10.1063/1.329533

[8]

FOLL H, UNPUB METAL SILICON

[9]

FOLL H, 1981, J APPL PHYS, V52, P250

[10]

FOLL H, PHIL MAG

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