THICK AMORPHOUS FILMS OF NI BASE ALLOYS USING HIGH-ENERGY (MEV) ION-BEAM MIXING

被引:7
作者
BHATTACHARYA, RS
PRONKO, PP
RAI, AK
MCCORMICK, AW
RAFFOUL, C
机构
关键词
D O I
10.1016/0168-583X(85)90454-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:694 / 700
页数:7
相关论文
共 6 条
[1]   DEPTH RESOLUTION OF SPUTTER PROFILING [J].
ANDERSEN, HH .
APPLIED PHYSICS, 1979, 18 (02) :131-140
[2]   GLASSY METALS [J].
CHEN, HS .
REPORTS ON PROGRESS IN PHYSICS, 1980, 43 (04) :353-+
[3]   ION-IMPLANTATION AND IRRADIATION STUDIES USING AMORPHOUS METALS [J].
GRANT, WA .
NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :809-826
[4]   AMORPHOUS FILM FORMATION BY ION MIXING IN BINARY METAL SYSTEMS [J].
LIU, BX ;
JOHNSON, WL ;
NICOLET, MA ;
LAU, SS .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 209 (MAY) :229-234
[5]   EXTREMELY HIGH CORROSION-RESISTANCE IN AMORPHOUS CR-B ALLOYS [J].
RUF, RR ;
TSUEI, CC .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (10) :5705-5710
[6]   MECHANISM OF ION-BEAM INDUCED MIXING OF LAYERED SOLIDS [J].
SIGMUND, P .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 30 (01) :43-46