COMMENSURATE AND INCOMMENSURATE PHASES AT RECONSTRUCTED (IN,GA)AS(001) SURFACES - X-RAY-DIFFRACTION EVIDENCE FOR A COMPOSITION LOCK-IN

被引:45
作者
SAUVAGESIMKIN, M
GARREAU, Y
PINCHAUX, R
VERON, MB
LANDESMAN, JP
NAGLE, J
机构
[1] THOMSON CSF,CENT RECH LAB,F-91404 ORSAY,FRANCE
[2] UNIV PARIS 06,CNRS,MINERAL CRISTALLOG LAB,F-75252 PARIS 05,FRANCE
[3] UNIV D DIDEROT,CNRS,MINERAL CRISTALLOG LAB,F-75252 PARIS 05,FRANCE
关键词
D O I
10.1103/PhysRevLett.75.3485
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Surface chemical ordering of group III elements in the ternary alloy InxGa1-xAs, stabilizing the 2 X 3 reconstruction at the surface composition In0.67Ga0.33As, is demonstrated on the basis of x-ray diffraction data. An incommensurate 2 X n reconstruction is observed for lower In surface concentrations, achieved by burying an InAs monolayer under a number of GaAs layers and letting the In surface segregation process operate. A quantitative account of the intensity measured in the incommensurate phase is obtained by using a probabilistic distribution of Ga- and In-rich structural elements.
引用
收藏
页码:3485 / 3488
页数:4
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