THE AU/SI(111)7X7 INTERFACE - CORRELATION BETWEEN ELECTRONIC AND MORPHOLOGICAL PROPERTIES BY HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY, ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY, AND TRANSMISSION ELECTRON-MICROSCOPY

被引：17

作者：

MATHIEU, G

CONTINI, R

LAYET, JM

MATHIEZ, P

GIORGIO, S

机构：

[1] FAC SCI LUMINY,CRMC2,F-13288 MARSEILLE 9,FRANCE

[2] FAC SCI LUMINY,UA 783,F-13288 MARSEILLE 9,FRANCE

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 05期

关键词：

D O I：

10.1116/1.575449

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2904 / 2909

页数：6

共 16 条

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