TEMPERATURE-DEPENDENCE OF THE SIZE EFFECT IN THIN CHROMIUM AND TIN FILMS

被引：5

作者：

ANGADI, MA ^{[1
]}

UDACHAN, LA ^{[1
]}

机构：

[1] KARNATAK UNIV, DEPT PHYS, Dharwad 580003, KARNATAKA, INDIA

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1983年 / 2卷 / 07期

关键词：

D O I：

10.1007/BF00726335

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：379 / 382

页数：4

共 25 条

[1] THE EFFECT OF THE DEPOSITION RATE ON THE ELECTRICAL-RESISTIVITY OF THIN TIN FILMS [J].

ANGADI, MA ;

UDACHAN, LA .

THIN SOLID FILMS, 1981, 78 (03) :299-302

[2] THERMOELECTRIC-POWER MEASUREMENTS IN THIN TIN FILMS [J].

ANGADI, MA ;

UDACHAN, LA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1981, 14 (07) :L103-L105

[3] THE EFFECT OF SUBSTRATE-TEMPERATURE ON THE ELECTRICAL-PROPERTIES OF THIN CHROMIUM FILMS [J].

ANGADI, MA ;

UDACHAN, LA .

JOURNAL OF MATERIALS SCIENCE, 1981, 16 (05) :1412-1415

[4] INFLUENCE OF DC ELECTRIC-FIELD ON SHEET RESISTANCE OF THIN TIN AND CHROMIUM FILMS [J].

ANGADI, MA ;

UDACHAN, LA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1981, 14 (05) :L81-L83

[5]

ANGADI MA, 1983, J MATER SCI LETT, V2

[6]

ANGADI MA, UNPUB J VAC SCI TECH

[7]

ANGADI MA, 1983, B AM PHYS SOC, V28

[8]

ANGADI MA, UNPUB APPL PHYS LETT

[9]

ANGADI MA, 1982, P SOLID STATE NUCL C, V25

[10]

Chopra K.L, 1969, THIN FILM PHENOMENA

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